Abstract
Photovoltaic (PV) energy production is currently increasing at a significant rate. A novel module architecture has been demonstrated that has potential for reducing manufacturing cost while improving module reliability and recycling for c-Si PV which utilizes an edge-seal. Referred to as Edge Sealed Module (ESM), this architecture eliminates the vacuum lamination process and cross-linked encapsulants on the interior of the module. Functioning prototypes of c-Si have been fabricated for stress testing in collaboration with National Renewable Energy Laboratories (NREL). These modules are being tested and compared to traditionally manufactured modules. Based on preliminary results, this module architecture is a potentially viable solution for improving the manufacturing cost and recyclability of PV modules while enhancing module performance.
| Original language | American English |
|---|---|
| Pages | 820-824 |
| Number of pages | 5 |
| DOIs | |
| State | Published - 2024 |
| Event | 2024 IEEE 52nd Photovoltaic Specialist Conference (PVSC) - Seattle, Washington Duration: 9 Jun 2024 → 14 Jun 2024 |
Conference
| Conference | 2024 IEEE 52nd Photovoltaic Specialist Conference (PVSC) |
|---|---|
| City | Seattle, Washington |
| Period | 9/06/24 → 14/06/24 |
NLR Publication Number
- NREL/CP-5K00-92709
Keywords
- costs
- manufacturing
- photovoltaic systems
- prototypes
- recycling
- reliability
- renewable energy sources
- stress
- testing
- vacuum arcs
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