Abstract
Our analyses show that defect clusters can lower the efficiency of multicrystalline silicon (mc-Si) solar cells by 2 to 4 absolute percentage points. This large loss can be recovered if impurities precipitated at the defect cluster sites can be gettered. We describe a new technique for gettering precipitated impurities.
| Original language | American English |
|---|---|
| Number of pages | 5 |
| State | Published - 2005 |
| Event | 2005 DOE Solar Energy Technologies Program Review Meeting - Denver, Colorado Duration: 7 Nov 2005 → 10 Nov 2005 |
Conference
| Conference | 2005 DOE Solar Energy Technologies Program Review Meeting |
|---|---|
| City | Denver, Colorado |
| Period | 7/11/05 → 10/11/05 |
Bibliographical note
Presented at the 2005 DOE Solar Energy Technologies Program Review Meeting held November 7-10, 2005 in Denver, Colorado. Also included in the proceedings available on CD-ROM (DOE/GO-102006-2245; NREL/CD-520-38557)NLR Publication Number
- NREL/CP-520-38957
Keywords
- dislocation generation
- NREL
- photovoltaics (PV)
- PV
- solar
- thermal stresses in Si
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