Correlative Characterization of Dislocation Defects and Defect Clusters in GaAs and CdTe Solar Cells by Spatially Resolved Optical Techniques and High-Resolution TEM

Q. Chen; B. McKeon; J. Becker; S. Zhang; C.-K. Hu; T. Gfroerer; Y.-H. Zhang; D. Smith; Y. Zhang

doi:10.1109/PVSC.2018.8548288

Correlative Characterization of Dislocation Defects and Defect Clusters in GaAs and CdTe Solar Cells by Spatially Resolved Optical Techniques and High-Resolution TEM

Q. Chen
, B. McKeon
, J. Becker
, S. Zhang
, C.-K. Hu
, T. Gfroerer
, Y.-H. Zhang
, D. Smith
, Y. Zhang

Materials Science

University of North Carolina at Charlotte
Arizona State University
Davidson College

Research output: Contribution to conference › Paper

1 Scopus Citations

Abstract

An array of correlative and spatially-resolved techniques, including electroluminescence, photoluminescence, Raman, I-V curve, and high-resolution TEM, have been performed on both GaAs and CdTe solar cells, to study the impact of individual dislocation defects and defect clusters on device performance, the dependence of the impact on the device operation conditions, and the microscopic structures of the defects. This approach offers quantitative and definitive correlation between the atomistic structure of a defect and its effects in a real device.

Original language	American English
Pages	3234-3236
Number of pages	3
DOIs	https://doi.org/10.1109/PVSC.2018.8548288
State	Published - 2018
Event	2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) - Waikoloa Village, Hawaii Duration: 10 Jun 2018 → 15 Jun 2018

Conference

Conference	2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC)
City	Waikoloa Village, Hawaii
Period	10/06/18 → 15/06/18

NLR Publication Number

NREL/CP-5K00-73681

Keywords

cadmium compounds
gallium arsenide
II-VI semiconductor materials
optical imaging
performance evaluation
photovoltaic cells

Access to Document

10.1109/PVSC.2018.8548288

Cite this

Chen, Q., McKeon, B., Becker, J., Zhang, S., Hu, C.-K., Gfroerer, T., Zhang, Y.-H., Smith, D., & Zhang, Y. (2018). Correlative Characterization of Dislocation Defects and Defect Clusters in GaAs and CdTe Solar Cells by Spatially Resolved Optical Techniques and High-Resolution TEM. 3234-3236. Paper presented at 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC), Waikoloa Village, Hawaii. https://doi.org/10.1109/PVSC.2018.8548288

@conference{58df9987fb16424195802903f676466a,

title = "Correlative Characterization of Dislocation Defects and Defect Clusters in GaAs and CdTe Solar Cells by Spatially Resolved Optical Techniques and High-Resolution TEM",

abstract = "An array of correlative and spatially-resolved techniques, including electroluminescence, photoluminescence, Raman, I-V curve, and high-resolution TEM, have been performed on both GaAs and CdTe solar cells, to study the impact of individual dislocation defects and defect clusters on device performance, the dependence of the impact on the device operation conditions, and the microscopic structures of the defects. This approach offers quantitative and definitive correlation between the atomistic structure of a defect and its effects in a real device.",

keywords = "cadmium compounds, gallium arsenide, II-VI semiconductor materials, optical imaging, performance evaluation, photovoltaic cells",

author = "Q. Chen and B. McKeon and J. Becker and S. Zhang and C.-K. Hu and T. Gfroerer and Y.-H. Zhang and D. Smith and Y. Zhang",

year = "2018",

doi = "10.1109/PVSC.2018.8548288",

language = "American English",

pages = "3234--3236",

note = "2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) ; Conference date: 10-06-2018 Through 15-06-2018",

}

Chen, Q, McKeon, B, Becker, J, Zhang, S, Hu, C-K, Gfroerer, T, Zhang, Y-H, Smith, D & Zhang, Y 2018, 'Correlative Characterization of Dislocation Defects and Defect Clusters in GaAs and CdTe Solar Cells by Spatially Resolved Optical Techniques and High-Resolution TEM', Paper presented at 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC), Waikoloa Village, Hawaii, 10/06/18 - 15/06/18 pp. 3234-3236. https://doi.org/10.1109/PVSC.2018.8548288

Correlative Characterization of Dislocation Defects and Defect Clusters in GaAs and CdTe Solar Cells by Spatially Resolved Optical Techniques and High-Resolution TEM. / Chen, Q.; McKeon, B.; Becker, J. et al.
2018. 3234-3236 Paper presented at 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC), Waikoloa Village, Hawaii.

Research output: Contribution to conference › Paper

TY - CONF

T1 - Correlative Characterization of Dislocation Defects and Defect Clusters in GaAs and CdTe Solar Cells by Spatially Resolved Optical Techniques and High-Resolution TEM

AU - Chen, Q.

AU - McKeon, B.

AU - Becker, J.

AU - Zhang, S.

AU - Hu, C.-K.

AU - Gfroerer, T.

AU - Zhang, Y.-H.

AU - Smith, D.

AU - Zhang, Y.

PY - 2018

Y1 - 2018

N2 - An array of correlative and spatially-resolved techniques, including electroluminescence, photoluminescence, Raman, I-V curve, and high-resolution TEM, have been performed on both GaAs and CdTe solar cells, to study the impact of individual dislocation defects and defect clusters on device performance, the dependence of the impact on the device operation conditions, and the microscopic structures of the defects. This approach offers quantitative and definitive correlation between the atomistic structure of a defect and its effects in a real device.

AB - An array of correlative and spatially-resolved techniques, including electroluminescence, photoluminescence, Raman, I-V curve, and high-resolution TEM, have been performed on both GaAs and CdTe solar cells, to study the impact of individual dislocation defects and defect clusters on device performance, the dependence of the impact on the device operation conditions, and the microscopic structures of the defects. This approach offers quantitative and definitive correlation between the atomistic structure of a defect and its effects in a real device.

KW - cadmium compounds

KW - gallium arsenide

KW - II-VI semiconductor materials

KW - optical imaging

KW - performance evaluation

KW - photovoltaic cells

U2 - 10.1109/PVSC.2018.8548288

DO - 10.1109/PVSC.2018.8548288

M3 - Paper

SP - 3234

EP - 3236

T2 - 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC)

Y2 - 10 June 2018 through 15 June 2018

ER -

Chen Q, McKeon B, Becker J, Zhang S, Hu CK, Gfroerer T et al.. Correlative Characterization of Dislocation Defects and Defect Clusters in GaAs and CdTe Solar Cells by Spatially Resolved Optical Techniques and High-Resolution TEM. 2018. Paper presented at 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC), Waikoloa Village, Hawaii. doi: 10.1109/PVSC.2018.8548288

Correlative Characterization of Dislocation Defects and Defect Clusters in GaAs and CdTe Solar Cells by Spatially Resolved Optical Techniques and High-Resolution TEM

Abstract

Conference

NLR Publication Number

Keywords

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