Correlations of Capacitance-Voltage Hysteresis with Thin-Film CdTe Solar Cell Performance During Accelerated Lifetime Testing

Research output: Contribution to conference › Paper

Original language	American English
Pages	318-322
Number of pages	5
DOIs	https://doi.org/10.1109/IRPS.2010.5488811
State	Published - 2010
Event	2010 IEEE International Reliability Physics Symposium (IRPS) - Garden Grove, California Duration: 2 May 2010 → 6 May 2010

Conference	2010 IEEE International Reliability Physics Symposium (IRPS)
City	Garden Grove, California
Period	2/05/10 → 6/05/10

NLR Publication Number

@conference{5a27a3715629418c8ece3b78f8e349c9,

title = "Correlations of Capacitance-Voltage Hysteresis with Thin-Film CdTe Solar Cell Performance During Accelerated Lifetime Testing",

keywords = "Cadmium Telluride, capacitance voltage hysteresis, CdTe, photovoltaic",

author = "David Albin and \{del Cueto\}, Joseph",

year = "2010",

doi = "10.1109/IRPS.2010.5488811",

language = "American English",

pages = "318--322",

note = "2010 IEEE International Reliability Physics Symposium (IRPS) ; Conference date: 02-05-2010 Through 06-05-2010",

}

TY - CONF

T1 - Correlations of Capacitance-Voltage Hysteresis with Thin-Film CdTe Solar Cell Performance During Accelerated Lifetime Testing

AU - Albin, David

AU - del Cueto, Joseph

PY - 2010

Y1 - 2010

KW - Cadmium Telluride

KW - capacitance voltage hysteresis

KW - CdTe

KW - photovoltaic

U2 - 10.1109/IRPS.2010.5488811

DO - 10.1109/IRPS.2010.5488811

M3 - Paper

SP - 318

EP - 322

T2 - 2010 IEEE International Reliability Physics Symposium (IRPS)

Y2 - 2 May 2010 through 6 May 2010

ER -