Abstract
Experimental measurements of coplanar waveguide circuits atop thin films of ferroelectric BaxSr1 - xTiO3 (BST) were made as a function ofdc bias from O to 200 Vand frequency from 0.045 to 20 GHz. The resulting phase shifts are compared with method-of-moments electromagnetic simulations and a conformai mapping analysis to determine the dielectric constant of the BST films. The accuracy of the resulting dielectric constants is analyzed and compared to low-frequency measurements of interdigitated capacitor circuits on the same films.
| Original language | American English |
|---|---|
| Pages (from-to) | 34-37 |
| Number of pages | 4 |
| Journal | Microwave and Optical Technology Letters |
| Volume | 29 |
| Issue number | 1 |
| DOIs | |
| State | Published - 2001 |
NLR Publication Number
- NREL/JA-520-30637
Keywords
- Coplanar waveguide
- Phase shifter
- Thin-film ferroelectric
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