Characterization of SWNT Thin Film Electrodes of Precisely Tuned Metal/Semiconductor Ratios with Optical and THz Spectroscopies: Abstract No. 1018

Michael Heben; Timothy McDonald

Characterization of SWNT Thin Film Electrodes of Precisely Tuned Metal/Semiconductor Ratios with Optical and THz Spectroscopies: Abstract No. 1018

Michael Heben
, Timothy McDonald

Chemistry and Nanoscience

National Renewable Energy Laboratory

Research output: Contribution to conference › Paper

Original language	American English
Number of pages	1017
State	Published - 2008
Event	213th Meeting of The Electrochemical Society - Phoenix, Arizona Duration: 18 May 2008 → 22 May 2008

Conference

Conference	213th Meeting of The Electrochemical Society
City	Phoenix, Arizona
Period	18/05/08 → 22/05/08

NLR Publication Number

NREL/AB-590-47360

Keywords

basic sciences
materials science

Cite this

@conference{73362650b8174e9fb607af1ccfeb096b,

title = "Characterization of SWNT Thin Film Electrodes of Precisely Tuned Metal/Semiconductor Ratios with Optical and THz Spectroscopies: Abstract No. 1018",

keywords = "basic sciences, materials science",

author = "Michael Heben and Timothy McDonald",

year = "2008",

language = "American English",

note = "213th Meeting of The Electrochemical Society ; Conference date: 18-05-2008 Through 22-05-2008",

}