Atomic Force Microscopy Study of FG-Annealed and PECVD Silicon Nitride AR-Coated Silicon Solar Cells

doi:10.1016/0960-1481(95)00054-N

Atomic Force Microscopy Study of FG-Annealed and PECVD Silicon Nitride AR-Coated Silicon Solar Cells

NREL

Research output: Contribution to journal › Article

Abstract

Atomic force microscopy has been used to study the surface structure and roughness of PECVD silicon nitride coated silicon solar cells. The surface roughness increases in some areas of the solar cells after forming gas annealing. It may be one of the reasons for better light absorption on the surface of the solar cells resulting in better solar cell performance.

Original language	American English
Pages (from-to)	589-591
Number of pages	3
Journal	Renewable Energy
Volume	6
Issue number	5-6
DOIs	https://doi.org/10.1016/0960-1481(95)00054-N
State	Published - 1995

NLR Publication Number

ACNR/JA-16910

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10.1016/0960-1481(95)00054-N

Cite this

@article{241d63cf60484c2ca90d7096b19e7131,

title = "Atomic Force Microscopy Study of FG-Annealed and PECVD Silicon Nitride AR-Coated Silicon Solar Cells",

abstract = "Atomic force microscopy has been used to study the surface structure and roughness of PECVD silicon nitride coated silicon solar cells. The surface roughness increases in some areas of the solar cells after forming gas annealing. It may be one of the reasons for better light absorption on the surface of the solar cells resulting in better solar cell performance.",

author = "NREL",

year = "1995",

doi = "10.1016/0960-1481(95)00054-N",

language = "American English",

volume = "6",

pages = "589--591",

journal = "Renewable Energy",

issn = "0960-1481",

publisher = "Elsevier Ltd.",

number = "5-6",

}

TY - JOUR

T1 - Atomic Force Microscopy Study of FG-Annealed and PECVD Silicon Nitride AR-Coated Silicon Solar Cells

AU - NREL, null

PY - 1995

Y1 - 1995

N2 - Atomic force microscopy has been used to study the surface structure and roughness of PECVD silicon nitride coated silicon solar cells. The surface roughness increases in some areas of the solar cells after forming gas annealing. It may be one of the reasons for better light absorption on the surface of the solar cells resulting in better solar cell performance.

AB - Atomic force microscopy has been used to study the surface structure and roughness of PECVD silicon nitride coated silicon solar cells. The surface roughness increases in some areas of the solar cells after forming gas annealing. It may be one of the reasons for better light absorption on the surface of the solar cells resulting in better solar cell performance.

U2 - 10.1016/0960-1481(95)00054-N

DO - 10.1016/0960-1481(95)00054-N

M3 - Article

SN - 0960-1481

VL - 6

SP - 589

EP - 591

JO - Renewable Energy

JF - Renewable Energy

IS - 5-6

ER -

Atomic Force Microscopy Study of FG-Annealed and PECVD Silicon Nitride AR-Coated Silicon Solar Cells

Abstract

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