Assessing the Causes of Encapsulant Delamination in PV Modules

John H. Wohlgemuth; Peter Hacke; Nick Bosco; David C. Miller; Michael D. Kempe; Sarah R. Kurtz

doi:10.1109/PVSC.2016.7749589

Assessing the Causes of Encapsulant Delamination in PV Modules

John H. Wohlgemuth
, Peter Hacke
, Nick Bosco
, David C. Miller
, Michael D. Kempe
, Sarah R. Kurtz

Materials Science

National Renewable Energy Laboratory

Research output: Contribution to conference › Paper › peer-review

33 Scopus Citations

Abstract

Delamination of the encapsulant is one of the most prevalent PV module field failures. This paper will present examples of various types of delaminations that have been observed in the field. It will then discuss the development of accelerated stress tests designed to duplicate those field failures and thus provide tools for avoiding them in the future.

Original language	American English
Pages	249-254
Number of pages	6
DOIs	https://doi.org/10.1109/PVSC.2016.7749589 https://doi.org/10.1109/PVSC.2016.7749589
State	Published - 18 Nov 2016
Event	43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States Duration: 5 Jun 2016 → 10 Jun 2016

Conference

Conference	43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
Country/Territory	United States
City	Portland
Period	5/06/16 → 10/06/16

Bibliographical note

Publisher Copyright:
© 2016 IEEE.

NLR Publication Number

NREL/CP-5J00-66715

Keywords

accelerated stress test
delamination
encapsulent

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Cite this

@conference{a4f985f5e2fb4227bff291e5194110b6,

title = "Assessing the Causes of Encapsulant Delamination in PV Modules",

abstract = "Delamination of the encapsulant is one of the most prevalent PV module field failures. This paper will present examples of various types of delaminations that have been observed in the field. It will then discuss the development of accelerated stress tests designed to duplicate those field failures and thus provide tools for avoiding them in the future.",

keywords = "accelerated stress test, delamination, encapsulent",

author = "Wohlgemuth, \{John H.\} and Peter Hacke and Nick Bosco and Miller, \{David C.\} and Kempe, \{Michael D.\} and Kurtz, \{Sarah R.\}",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 ; Conference date: 05-06-2016 Through 10-06-2016",

year = "2016",

month = nov,

day = "18",

doi = "10.1109/PVSC.2016.7749589",

language = "American English",

pages = "249--254",

}

TY - CONF

T1 - Assessing the Causes of Encapsulant Delamination in PV Modules

AU - Wohlgemuth, John H.

AU - Hacke, Peter

AU - Bosco, Nick

AU - Miller, David C.

AU - Kempe, Michael D.

AU - Kurtz, Sarah R.

PY - 2016/11/18

Y1 - 2016/11/18

N2 - Delamination of the encapsulant is one of the most prevalent PV module field failures. This paper will present examples of various types of delaminations that have been observed in the field. It will then discuss the development of accelerated stress tests designed to duplicate those field failures and thus provide tools for avoiding them in the future.

AB - Delamination of the encapsulant is one of the most prevalent PV module field failures. This paper will present examples of various types of delaminations that have been observed in the field. It will then discuss the development of accelerated stress tests designed to duplicate those field failures and thus provide tools for avoiding them in the future.

KW - accelerated stress test

KW - delamination

KW - encapsulent

UR - https://www.scopus.com/pages/publications/85003441434

U2 - 10.1109/PVSC.2016.7749589

DO - 10.1109/PVSC.2016.7749589

M3 - Paper

AN - SCOPUS:85003441434

SP - 249

EP - 254

T2 - 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016

Y2 - 5 June 2016 through 10 June 2016

ER -

Assessing the Causes of Encapsulant Delamination in PV Modules

Abstract

Conference

Bibliographical note

NLR Publication Number

Keywords

Access to Document

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Cite this