Applications of Scanning Defect Mapping System for Semiconductor Characterization

Applications of Scanning Defect Mapping System for Semiconductor Characterization

NREL

Research output: Contribution to conference › Paper

Original language	American English
Pages	579-583
Number of pages	5
State	Published - 1995
Event	Defect and Impurity Engineered Semiconductors and Devices: Materials Research Society Symposium - San Francisco, California Duration: 17 Apr 1995 → 21 Apr 1995

Conference

Conference	Defect and Impurity Engineered Semiconductors and Devices: Materials Research Society Symposium
City	San Francisco, California
Period	17/04/95 → 21/04/95

NLR Publication Number

NREL/CP-413-7375

Cite this

@conference{77e0bb4fd79c46e1a465b31ff1e10ad8,

title = "Applications of Scanning Defect Mapping System for Semiconductor Characterization",

author = "NREL",

year = "1995",

language = "American English",

pages = "579--583",

note = "Defect and Impurity Engineered Semiconductors and Devices: Materials Research Society Symposium ; Conference date: 17-04-1995 Through 21-04-1995",

}