Abstract
This brochure presents the capabilities that the Measurements and Characterization Division has in Analytical Microscopy, in which a variety of sophisticated techniques are used to study a material's topographical, crystallographic, structural, chemical, and luminescence properties.
| Original language | American English |
|---|---|
| Publisher | National Laboratory of the Rockies (NLR) |
| Number of pages | 8 |
| State | Published - 2000 |
NLR Publication Number
- NREL/BR-530-22212
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