Abstract
Rapid adoption of solar generation in both commercial and residential applications has highlighted the importance of addressing operational factors that impact the safety and reliability of solar assets. Failures in PV connector modules is widely recognized as one main contributor to reduced efficiency of solar based generation. From cross-mating of connectors to improper assembly practices in the field, multiple reasons have been cited to explain the failures of such PV connectors. However, no structured study has investigated variability in commercially available connectors, in particular on the metallization practices employed by different manufacturers, as a factor that may result in variable field performance. A DOE sponsored project is investigating the reliability of balance of system (BOS) components in the US. A part of this project is focused on developing baseline information about commercially available connectors, understanding connector performance using well-developed accelerated tests and conducting forensic analysis of field failures in BOS components. As part of this effort, the surface coating structure of metallic interconnects in PV connectors from multiple manufacturers, which includes several different connector models, are under investigation. Project findings from the analysis of surface coating in seven different models of commercially available connectors from three prominent manufacturers are presented and compared in this article.
| Original language | American English |
|---|---|
| Number of pages | 8 |
| DOIs | |
| State | Published - 2025 |
| Event | IEEE Holm Conference on Electrical Contacts - San Antonio, TX Duration: 15 Oct 2025 → 22 Oct 2025 |
Conference
| Conference | IEEE Holm Conference on Electrical Contacts |
|---|---|
| City | San Antonio, TX |
| Period | 15/10/25 → 22/10/25 |
NLR Publication Number
- NLR/CP-5K00-99590
Keywords
- coating degradation
- metallization
- PV connectors
- surface coating
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