| Original language | American English |
|---|---|
| Number of pages | 4 |
| Journal | Applied Physics Letters |
| Volume | 102 |
| Issue number | 1 |
| DOIs | |
| State | Published - 2013 |
NLR Publication Number
- NREL/JA-5200-58065
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An Extended Defect as a Sensor for Free Carrier Diffusion in a Semiconductor: Article No. 012114
- Mark Manlass
- , Yong Zhang
- , Timothy Gfroerer
- National Renewable Energy Laboratory
- University of North Carolina at Charlotte
- Davidson College
Research output: Contribution to journal › Article › peer-review