Amplitude Dependence of Metastable Defect Formation

Amplitude Dependence of Metastable Defect Formation

NREL

Research output: Contribution to conference › Paper

Original language	American English
Pages	249-254
Number of pages	6
State	Published - 1993
Event	Amorphous Silicon Technology - 1993: Materials Research Society Symposium - San Francisco, California Duration: 13 Apr 1993 → 16 Apr 1993

Conference

Conference	Amorphous Silicon Technology - 1993: Materials Research Society Symposium
City	San Francisco, California
Period	13/04/93 → 16/04/93

Bibliographical note

Work performed by Xerox Palo Alto Research Center, Palo Alto, California

NLR Publication Number

ACNR/CP-14385

Cite this

@conference{1ebef19563b94d1788cc67f1d414bb2d,

title = "Amplitude Dependence of Metastable Defect Formation",

author = "NREL",

note = "Work performed by Xerox Palo Alto Research Center, Palo Alto, California; Amorphous Silicon Technology - 1993: Materials Research Society Symposium ; Conference date: 13-04-1993 Through 16-04-1993",

year = "1993",

language = "American English",

pages = "249--254",

}