A Dry Heat-Induced Effect of Using Silver in CIGS Gridlines

J. R. Mann; M. Kempe; I. Repins; A. Duda; S. Glick; A. Kanevce

doi:10.1109/JPHOTOV.2012.2219852

A Dry Heat-Induced Effect of Using Silver in CIGS Gridlines

J. R. Mann
, M. Kempe
, I. Repins
, A. Duda
, S. Glick
, A. Kanevce

National Renewable Energy Laboratory

Research output: Contribution to journal › Article › peer-review

Abstract

The ease with which screen-printed silver is deposited and its high conductivity make it an appealing choice for gridline material on CIGS-based photovoltaic devices. However, present results suggest silver diffusion into the device can cause severe reductions in efficiency after as little as 200 h at 85 °C. Dramatic reductions in fill factor, characterized by unusual inflections in the power quadrant of current-voltage curves, are observed for devices with silver gridlines but not for those with nickel or aluminum gridlines. The shape of the current-voltage curves demonstrate that the degradation mode is not simply due to changes in resistance but is consistent with the creation of a secondary barrier near the device junction.

Original language	American English
Article number	6338995
Pages (from-to)	457-460
Number of pages	4
Journal	IEEE Journal of Photovoltaics
Volume	3
Issue number	1
DOIs	https://doi.org/10.1109/JPHOTOV.2012.2219852 https://doi.org/10.1109/JPHOTOV.2012.2219852
State	Published - 2013

NLR Publication Number

NREL/JA-5200-56300

Keywords

Buffer
Cu(In,Ga)Se (CIGS)
diffusion
gridlines
photocurrent
silver

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title = "A Dry Heat-Induced Effect of Using Silver in CIGS Gridlines",

abstract = "The ease with which screen-printed silver is deposited and its high conductivity make it an appealing choice for gridline material on CIGS-based photovoltaic devices. However, present results suggest silver diffusion into the device can cause severe reductions in efficiency after as little as 200 h at 85 °C. Dramatic reductions in fill factor, characterized by unusual inflections in the power quadrant of current-voltage curves, are observed for devices with silver gridlines but not for those with nickel or aluminum gridlines. The shape of the current-voltage curves demonstrate that the degradation mode is not simply due to changes in resistance but is consistent with the creation of a secondary barrier near the device junction.",

keywords = "Buffer, Cu(In,Ga)Se (CIGS), diffusion, gridlines, photocurrent, silver",

author = "Mann, \{J. R.\} and M. Kempe and I. Repins and A. Duda and S. Glick and A. Kanevce",

year = "2013",

doi = "10.1109/JPHOTOV.2012.2219852",

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T1 - A Dry Heat-Induced Effect of Using Silver in CIGS Gridlines

AU - Mann, J. R.

AU - Kempe, M.

AU - Repins, I.

AU - Duda, A.

AU - Glick, S.

AU - Kanevce, A.

PY - 2013

Y1 - 2013

N2 - The ease with which screen-printed silver is deposited and its high conductivity make it an appealing choice for gridline material on CIGS-based photovoltaic devices. However, present results suggest silver diffusion into the device can cause severe reductions in efficiency after as little as 200 h at 85 °C. Dramatic reductions in fill factor, characterized by unusual inflections in the power quadrant of current-voltage curves, are observed for devices with silver gridlines but not for those with nickel or aluminum gridlines. The shape of the current-voltage curves demonstrate that the degradation mode is not simply due to changes in resistance but is consistent with the creation of a secondary barrier near the device junction.

AB - The ease with which screen-printed silver is deposited and its high conductivity make it an appealing choice for gridline material on CIGS-based photovoltaic devices. However, present results suggest silver diffusion into the device can cause severe reductions in efficiency after as little as 200 h at 85 °C. Dramatic reductions in fill factor, characterized by unusual inflections in the power quadrant of current-voltage curves, are observed for devices with silver gridlines but not for those with nickel or aluminum gridlines. The shape of the current-voltage curves demonstrate that the degradation mode is not simply due to changes in resistance but is consistent with the creation of a secondary barrier near the device junction.

KW - Buffer

KW - Cu(In,Ga)Se (CIGS)

KW - diffusion

KW - gridlines

KW - photocurrent

KW - silver

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DO - 10.1109/JPHOTOV.2012.2219852

M3 - Article

AN - SCOPUS:84871765889

SN - 2156-3381

VL - 3

SP - 457

EP - 460

JO - IEEE Journal of Photovoltaics

JF - IEEE Journal of Photovoltaics

IS - 1

M1 - 6338995

ER -

A Dry Heat-Induced Effect of Using Silver in CIGS Gridlines

Abstract

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Keywords

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